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CJC8910
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Application description
Audio chip
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ASIC standard/custom development
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ESD testing (HBM)
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Update Notice
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Main Control Zone
CJC8910
CJC6811A
CJC8988
CJC8990
Application description
Audio chip
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MCU
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Temperature and Humidity Cycle (TCT)
High and Low Temperature Testing (L/HTSL)
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> ESD testing (HBM)
CJC6811A_HTSL_12H
release time:2023-03-16
publisher:CSC
CJC6811A_HTSL_125℃ 12H
CJC8974A_ Temperature cycle test report
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