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Main Control Zone
CJC8910
CJC6811A
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CJC8990
Application description
Audio chip
Capacitive touch chip
MCU
Power management IC
ASIC standard/custom development
Product Demo
Product Demo
Third party testing report
ESD testing (HBM)
Temperature and Humidity Cycle (TCT)
High and Low Temperature Testing (L/HTSL)
Update Notice
Update Notice
Product Demo
Main Control Zone
CJC8910
CJC6811A
CJC8988
CJC8990
Application description
Audio chip
Capacitive touch chip
MCU
Power management IC
ASIC standard/custom development
Product Demo
Product Demo
Third party testing report
ESD testing (HBM)
Temperature and Humidity Cycle (TCT)
High and Low Temperature Testing (L/HTSL)
Update Notice
Update Notice
Third party testing report
Main Control Zone
CJC8910
CJC6811A
CJC8988
CJC8990
Application description
Audio chip
Capacitive touch chip
MCU
Power management IC
ASIC standard/custom development
Product Demo
Product Demo
Third party testing report
ESD testing (HBM)
Temperature and Humidity Cycle (TCT)
High and Low Temperature Testing (L/HTSL)
Update Notice
Update Notice
Update Notice
Main Control Zone
CJC8910
CJC6811A
CJC8988
CJC8990
Application description
Audio chip
Capacitive touch chip
MCU
Power management IC
ASIC standard/custom development
Product Demo
Product Demo
Third party testing report
ESD testing (HBM)
Temperature and Humidity Cycle (TCT)
High and Low Temperature Testing (L/HTSL)
Update Notice
Update Notice
Home
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Third party testing report
> ESD testing (HBM)
CT8333-Q_ DFN4_ ESD test report
release time:2023-03-02
publisher:CSC
CT8333-Q_ SOT23-6_ ESD test report
8233LE_ ESD test report
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